준비중입니다.
저자 김갑진
E-mail : [email protected]
To cite this article:
Kim, D., Oh, YW., Kim, J.U. et al. Extreme anti-reflection enhanced magneto-optic Kerr effect microscopy. Nat Commun 11, 5937 (2020)
DOI:
https://doi.org/10.1038/s41467-020-19724-7